Used ELECTROGLAS / EG 4090 #293767864 for sale

ELECTROGLAS 4090 Prober is a wafer-level testing solution with automated test platform and pinpoint accuracy for semiconductor wafer testing. It is designed for production testing of integrated circuits and other electronic devices, allowing for fast and reliable process analysis. This prober features an automated test platform that can support up to eight test sites, with each site having two test cassettes. It is designed to host a wide variety of test probes and sample configurations. The integrated test sites are equipped with full-wave capacitance metrology, automated focus and an advanced programmable logic controller (PLC). Additionally, the prober has an automated workspace that can support multiple probing and load board configurations, as well as manual operation. This provides high-performance and flexibility when testing multiple devices and sample sizes. 4090 Prober is equipped with a unique dynamic calibration equipment that ensures its full accuracy when used in production environments. This system continually adjusts its scanning parameters, leading to high throughput and reliability. Additionally, the prober includes an advanced automatic guided probe unit that eliminates the need for manual adjustments of the test sites after each wafer's testing. This makes the prober's operation fast and user-friendly. ELECTROGLAS 4090 Prober is available with an optional High Speed Scanning Module to reduce the cycle time needed for testing. This scanning module uses multiple lasers to rapidly scan the circuit boards, thus reducing the total test time of the device. Additionally, this prober is capable of testing multiple wafers simultaneously, which increases production efficiency. 4090 Prober's advanced features, such as its dynamic calibration machine, high-speed scanning module, and automated test platform, make it ideal for general semiconductor, memory, and logic testing. Its automated features and pinpoint accuracy are perfect for ensuring maximum accuracy, reliability, and productivity.