Used ELECTROGLAS / EG 4090 #9355734 for sale

ELECTROGLAS 4090 is a state-of-the-art, professional prober designed for semiconductor device testing and failure analysis. It is equipped with an advanced, computer controlled test equipment which allows for fast and accurate probing. The prober is designed for fast, accurate and repeatable device probing and works with a wide variety of probe head configurations and tip sizes. This results in accurate probing of various semiconductor components such as transistors and integrated circuits. 4090 utilizes a non-contact drive mechanism capable of controlling movement with nanometer level accuracy. It has four rotary drive motors which act as the primary power source for the beams and three linear motor stages which allow for variable orientation of the probe heads. The linear motor stages are also equipped with two needle lifting mechanisms using four channels, allowing for smooth needle movement. The prober is also equipped with an additional feature; a calibrated 8" x 6" table which provides the force needed for device probing. The zero voltage contact force feature allows the system to detect unbridged bond pads and helps to ensure accurate probing. The unit safety is further enhanced with the presence of an electronically adjustable overshoot fence. This safety feature prevents the prober from exceeding the programmed probing force and helps to eliminate damage of the delicate semiconductor devices. ELECTROGLAS 4090 is capable of probing a wide range of complex devices from multiple companies. It is also designed to support various shapes and sizes of contact tips, allowing for quick and easy probe head changes. The prober is equipped with a PC-Based control machine and it is designed to support standard SEMI automation commands and modules. This allows for remote control of the prober by a PC and it also enables compatibility with other test systems. 4090 is an advanced, professional prober with a long list of impressive features. It is designed for fast and accurate probing of a wide range of complex semiconductor devices. It is equipped with an advanced, computer controlled test tool, allowing for accurate and repeatable probing. Additionally, it is capable of supporting various shapes and sizes of contact tips, as well as PC-based control systems. The prober is a reliable and robust device designed for fast and accurate device testing and failure analysis.