Used ELECTROGLAS / EG 4090FX #293662919 for sale

ELECTROGLAS / EG 4090FX is an advanced mechanical and electrical prober that provides reliable and precise measurements of small chips. It is an automated wafer prober designed for both wafer-level and packaged device testing. EG 4090FX accomplishes its probing tasks through a combination of advanced technologies including a Monitored Precision Probe (MPP). The MPP is a patented probe equipment that monitors and eliminates mechanical misalignments between electrodes of the prober. Through this system, users can precisely measure diagonal and off-axis distances, as well as individual parts, without time-consuming adjustments. This prober has a high-tech pressure unit that applies laminar force to position the probe tip and ensure reliable testing. It also features a microprocessor based control machine, motorized XY stage, and state-of-the-art motion control tool, all of which are necessary to achieve quick and precise measurements. ELECTROGLAS 4090FX offers a highly reliable testing environment featuring a built-in environmental control asset with temperature and humidity sensors. These sensors accurately monitor and control environmental conditions during the testing process, which eliminates the need for manual calibration or monitoring of the environmental conditions. 4090FX is designed for both small chip and large wafer testing applications. It is compatible with a range of probing equipment, including a high-precision motorized XY stage, environment control model, and various probe heads. Furthermore, it is capable of performing highly complex probing tasks, such as probing surface mount (SMT) soldered components. This prober features an integrated data acquisition equipment, which enables users to collect data about the components using just a few clicks. This system also allows users to store and analyze different test results quickly and easily, so that they can make decisions quickly when necessary. ELECTROGLAS / EG 4090FX provides users with precise testing results while being easy to use and maintain. It is suitable for a wide range of applications, ranging from microelectronic and nanoscale materials investigation to industrial quality control. This prober is ideal for those who need to quickly and accurately measure small components.