Used ELECTROGLAS / EG 4090u #293586843 for sale
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ELECTROGLAS / EG 4090u is a prober designed to enable non-invasive testing and analysis of a variety of different electrical, optoelectronic and semiconductor devices. It is a high performance solution that can conduct comprehensive measurements and tests of a range of devises from simple device characterization to complex wafer probing tasks. EG 4090u is built with 40 and 60 Gohm impedance systems that makes it more confident in production testing and fault diagnosis and enables users to work with a variety of interfacing solutions, like Ethernet and both GPIB and VXI buses. The prober is supported by 4 independent voltage and a 4-position DC to 5 GHz RF converter, a dual wafer chucking system and standard handling accessories. The prober offers some excellent features that enhance users' testing and analysis experience. ELECTROGLAS 4090 U has 6.5 GHz differential transmission line measurements and it is capable of meeting test requirements of up to 150GHz and additionally supports up to 1mm tape. Moreover, the prober also incorporates an advanced engineering station for data storage, further allows access to multiple device test parameters in real time, enabling fast, reliable and efficient data acquisition and interpretation. This could be useful for advanced device characterization and yield improvement. ELECTROGLAS / EG 4090 U has an easy-to-use graphical user interface that enables users to maximize throughput, accuracy, and reliability. It also offers support for multiple wafer sizes and materials and enables flexible tool control, allowing users to customize the system to ensure best performance and accuracy in specific application areas. The prober is highly reliable and is compliant with ISO 9000, ISO 14001, and UL environmental standards. It is suitable for many production and engineering environments, and is ideal for applications such as single device testing, DC parametric analysis, noise and parametric testing, memory pin testing, and wafer level testing.
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