Used ELECTROGLAS / EG 4090u+ #293589312 for sale

ELECTROGLAS / EG 4090u+ Prober is one of the most advanced probing solutions available. EG 4090 U+ is a multi-application multi-probe prober for high-speed, high-density probing applications. It can measure the electrical characteristics at different locations on each wafer or series of wafers with its advanced multi-probe technology. It has a single path robotic arm that is capable of simultaneous wafer, die, and sub-die probing with high accuracy and speed. This allows users to quickly and accurately test multiple devices without having to switch probes or adjust the setup. The equipment also features a large probing area for high throughput and it also incorporates advanced vision system for locating test sites accurately and efficiently. Furthermore, ELECTROGLAS EG4090U+ uses a powerful integrated computational platform with advanced software that can support different probing application systems. It can handle a variety of automated probing algorithms, such as device connections, multisite systematic probing, and fault localization. Moreover, the software can also control the test parameters, the wafer-to-probe connections, and the probe alignment. ELECTROGLAS 4090 U+ Prober is equipped with a motorized XYZ stage that provides precise, uniform movement for detailed probing operations. Additionally, the unit has the capability to store multiple probe positions for further probing. It also features an ergonomic design and easy accessibility to the probe card, allowing operators to quickly reconfigure the prober when needed. Moreover, ELECTROGLAS / EG 4090 U+ Prober integrates an advanced optoelectronic monitoring machine that works with various laser-based height measuring equipment. This ensures that the probe is always properly aligned to the wafer and that the optimal probe tip position is maintained. Additionally, it can also detect wafer contamination, ensuring that only clean wafers are probed. Overall, 4090 U+ Prober offers a reliable solution for large-scale high-speed probing operations, with the ability to support different application systems. Its versatile design and integrated software provide unmatched flexibility and accuracy for testing and diagnostics.