Used ELECTROGLAS / EG 4090u #293589317 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 293589317
Vintage: 1999
Prober Commander version: DOS EGC 7.3.8 DCM Version: DCM 2 VM Alignment system DPS Camera Z-Stage: 0.125 Chuck material: Nickel Chuck type: Hot DPS Camera Scrub pad LCD Monitor Material handler module Display control module Prober control module Vision module OCR Camera Bridge camera: COHU 1999 vintage.
ELECTROGLAS / EG 4090u is a versatile wafer prober that is equipped with an advanced scanning laser interferometer for better accuracy and repeatability. This prober utilizes an integrated, 9-axis mechanical moving equipment in order to accurately and quickly align probes for a wide range of applications. Its high precision and repeatability allow for quick and reliable wafer probing, making it a great tool for automated testing. The prober is capable of supporting multi-site operations and has the ability to handle a large range of workpieces. It has a digital video microscope that provides a magnified view of its target. This microscope has an adjustable range of magnification, up to an impressive 40x. Additionally, the prober is also equipped with an advanced control system, which allows users to control the timing and speed of the motors and the device's various parameters. EG 4090u has a maximum wafer size of 8 inches and can handle wafers up to 0.6mm thick. It has a vacuum chuck that provides an ideal holding mechanism for wafers, while the automatic wafer transfer unit ensures the wafers are moved quickly and safely. The prober also has a built-in HeNe laser machine, which accurately aligns the probe to the die's coordinates with a resolution of up to 0.5 µm. Overall, ELECTROGLAS 4090 U has features that provide high levels of performance and accuracy, making it an excellent choice for a wide range of wafer probing operations. Its multi-site support and integrated digital video microscope make it a flexible device that can accommodate various automation processes with minimal setup time. With its high precision and repeatability, this prober can be an important part of efficient and high-accuracy probing operations.
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