Used ELECTROGLAS / EG 4090u #293592712 for sale

ELECTROGLAS / EG 4090u is a high-precision prober used for probing electronic devices. It is typically used to measure the electrical properties of integrated circuit components for research, development, and testing purposes. This prober is an advanced wafer-level system that uses a combination of scanning tunnelling microscopy (STM), atomic force microscopy (AFM), and electrostatic force microscopy (EFM) to provide Electrical Characterization, mapping, streaming curve analysis, and probing of wafers, chips, and circuit components. EG 4090u has a lightweight, compact design, with a footprint of 200mm x 160mm. It operates in a vacuum environment and is designed to work with a variety of probe tips, such as: jigs, electrical test cards, manual probes and electrical leads. ELECTROGLAS 4090 U has the ability to sense, measure and control the electrical potential and current while performing measurements of up to 4GHz. The automated wafer and chip detection capabilities, combined with the automated sample staging, provide enhanced probing accuracy and repeatability. 4090 U also has built-in software for visualizing and recording data from the probe tips and electrodes, as well as monitoring waveforms simultaneously. In addition, EG 4090 U has the capability to save waveforms for later analysis. It also has the ability to detect and track devices that move during probing. ELECTROGLAS 4090u is equipped with safety features to protect itself from damage and the environment from hazardous materials. It operates in temperatures between 10 and 35 degrees Celsius, therefore minimizing environmental risks. ELECTROGLAS / EG 4090 U provides outstanding accuracy in the range of 0.2 nanometres, due to its low noise levels. Overall, 4090u is a highly accurate, efficient and reliable prober capable of performing repeatable, high-precision measurements on wafers, chips, and circuit components. It's compact design and easy to use software make it an excellent choice for advanced wafer-level testing and measurement.