Used ELECTROGLAS / EG 4090u #293593048 for sale

ELECTROGLAS / EG 4090u is a parametric test prober that can be used for standalone or automated testing. It features a unique design that allows for manual, stepped, and automated testing capabilities. EG 4090u is a fully integrated die-sort test solution that combines high-capacity electrical parameters testing capabilities with die selector as a complete package. The main component of ELECTROGLAS 4090 U is its automatic wafer-level prober. It offers a platform with a maximum wafer diameter of 200 mm and a 100 mm diameter pocket. It is designed to reliably pick and place a wide range of silicon- or thin-film substrates. The prober can be configured with vision-assisted alignment and options for three-dimensional probing. It is also designed to minimize false rejects and significant yield gains. EG 4090 U is designed to test thin-film transistor (TFT) and complementary metal-oxide semiconductor (CMOS) devices using automatic die selector, manipulating the electronic interface of the device. The probe can also be used to test memory devices, such as Flash, Static RAM (SRAM), and Dynamic Random Access Memory (DRAM), as well as power semiconductor devices. Its automated testing capabilities and on-board computer-controlled data acquisition and analysis capabilities, ensures accurate testing. ELECTROGLAS / EG 4090 U also features a suite of measurement technologies, and interfaces. It is also equipped with powerful software tools to help with device and circuit characterization, as well as data analysis. The tool provides useful information for parametric testing and device characterization. 4090 U is capable of parametric test coverage on a wide range of different test applications, and can be used for both manual and automated testing. It is an effective prober solution that provides high yields and improved regularity, in addition to reduced total test time.