Used ELECTROGLAS / EG 4090u #293602010 for sale

ELECTROGLAS / EG 4090u
Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 293602010
Probers.
ELECTROGLAS / EG 4090u is a prober used for testing semiconductor devices. It is a multi-function, multi-application equipment for testing digital, analog, and mixed-signal integrated circuits. The prober uses position sensing and advanced optics for fast, accurate probing of the device under test. EG 4090u features an X-Y coordinate measurement system to ensure accurate and repeatable probing. The location of the probe tip can be measured in sub-micron increments with a resolution of 1 um accuracy or better. Positioning accuracy is ±1 µm and repeatability is less than one half-micron. ELECTROGLAS 4090 U uses a multi-function mapping head, which supports multiple tips, such as active contact spring tip, passive contact spring tip, and a wide range of other chips and specialty contacts. In addition, special tips and probes can be designed to meet specific application requirements. The unit is controlled by a suite of software that provides easy operation. The software suite includes several subsystems: the Controller, the Software Development and the Machine Design, each fully tailored to the customer's specific needs. The Controller includes all hardware and software components for the automatic control of the prober and device interface components. It also handles communications, data exchange and reporting functions. The Software Development subsystem allows customers to develop their own applications and control libraries for probing. The Tool Design subsystem guides customers through the setting up of the prober and measuring asset. ELECTROGLAS 4090u also features temperature control and temperature feedback, vibration isolation, and an enhanced power guard to protect the prober from electrical surges. In addition, the prober is available with a variety of environmental rooms for various testing needs. ELECTROGLAS / EG 4090 U is a reliable and versatile prober designed for use in high-volume production environments. This prober provides a fast and accurate way to test semiconductor devices. The software suite and mapping head provide customers with control and flexibility, while the temperature control, isolation, and power guard ensure safe operation.
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