Used ELECTROGLAS / EG 4090u #293603735 for sale

ELECTROGLAS / EG 4090u Prober is a third-generation wafer microscope that provides highly accurate measurements for all types of semiconductor devices. This prober includes features such as an advanced touchscreen user-interface, flexible high positional accuracy, and a wide range of high-end features to ensure efficient probing of devices. EG 4090u utilizes a 15 micron XY table with Z drive stages and a 6-axis robotic arm, allowing for highly accurate sample movement and alignment. ELECTROGLAS 4090 U Prober boasts an impressive array of measuring capabilities: the device can measure a wide range of parameters, including die area, contact size, soldering and welding, resistance, and temperature. These measurements can be made on wafers and flip chips alike, with lead frames, gullys, and other circuit components being factored into the assessment. This prober also offers image-based defect inspection and analysis that can quickly detect material and dimensional discrepancies. Through powerful digital image processing and analysis algorithms, highly accurate 3D measurements can be taken. The microscope even has an integrated vision system for defect inspection and measuring capability. The device is capable of running on a wide range of technologies, such as system-in-package (SIP), lead frames, and die banks. This prober also has a lightweight air motion platform, which makes it suitable for operation and production environments. 4090u also offers a wide range of communication protocols, allowing for a variety of networking and data processing possibilities. This prober is also compliant with safety regulations, and features advanced safety features as well. ELECTROGLAS 4090u Prober is the perfect tool for users looking to rapidly obtain accurate and reliable measurements for their semiconductor devices. With advanced features, such as an intuitive touchscreen user-interface, a wide range of measuring capabilities, an air motion platform and an integrated vision system for defect inspection and measuring, this prober offers an efficient and effective solution for measuring a variety of semiconductor devices.