Used ELECTROGLAS / EG 4090u #293603739 for sale

ELECTROGLAS / EG 4090u
Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 293603739
Wafer prober.
ELECTROGLAS / EG 4090u is a prober for memory and logic testing and measurement applications. It offers fast and accurate probing for a range of devices, from small to large wafer sizes. The equipment features a superior field of view that enables precise, repeatable probing in a variety of challenging conditions. EG 4090u features a powerful, highly configurable dual-probe head. This allows for precise, repeatable probing on a variety of device geometries, including fine-pitch ICs, flexible module contactors, and multi-finger IC packages. The dual-probe head also eliminates the need for manual reference probe switching, which reduces testing time and improves the accuracy of wafer-level manufacturing testing and probing. The precise and repeatable scanning of ELECTROGLAS 4090 U is enabled by a streamlined three-axis motor positioning and monitoring system. This unit allows for precise location and alignment of the probes, ensuring that their locations remain consistent and repeatable over time. This high-precision machine is backed by a comprehensive suite of full-featured prober control software. This software allows for high-level control of the prober's various components, and makes it easy to define and monitor complex, repeatable probing and testing sequences. 4090 U supports a variety of test programs, scripting languages and debugging tools. This range of tools facilitates effortless setup and debugging of demanding tool-level testing and probing, allowing users to quickly capture electronic design data. Additionally, the asset supports a wide range of tips, allowing users to easily customize their model for different probing and testing tasks. The SOFTWARE can automatically set up the equipment to use the best probe configuration for the task at hand. ELECTROGLAS / EG 4090 U includes an integrated environmental chamber. This chamber provides a temperature-controlled environment for testing and probing of sensitive devices, ensuring that device temperatures remain stable, thus improving performance and test accuracy. Additionally, the integrated chamber enables fast temperature cycling, which helps to ensure reliable probing. Overall, EG 4090 U is a reliable, robust and highly configurable prober for memory and logic testing and measurement applications. Its powerful dual-probe head, motor positioning and monitoring system, and range of tips provide precise, repeatable probing for many challenging device geometries. Additionally, its integrated environmental chamber and temperature-controlled capability help to assure accurate and reliable testing and probing.
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