Used ELECTROGLAS / EG 4090u #293606412 for sale
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ID: 293606412
Wafer Size: 6"-8"
Wafer prober, 6"-8"
Standard chuck
Ambient temperature.
ELECTROGLAS / EG 4090u is a prober that is used for wafer probing applications. It is a multi-functional, multi-user test system, designed to provide the highest system performance and flexibility. EG 4090u prober is the industry-leading system for semiconductor device test and characterization applications. ELECTROGLAS 4090 U features full four-directions of probing, up to two probes at one time, and up to 1,024 active test sites. The prober's maximum testing speed is 1000 probes per second, with a maximum stage speed of 600 mm/second in X-axis, 250 mm/second in Y-axis, and 500, 1000, and 2000 mm/second in Z-axis. Its force range is adjustable from 0.5-10g, enabling users to probe low-K dielectric devices. The prober is also capable of measuring small signals with high accuracy and dynamic range, with 1x6 probe channels and 9x20 micron contact force control. Through these features, 4090u is ideal for highest performance contactor testing, allowing prober users to probe in tight topography, low-K and fine pitch applications. The prober also features mechanical accuracy of <3.5 µm, enabling users to measure high-accuracy probing on targets as small as 5 microns in diameter. The prober has an intuitive user interface and is equipped with Ethernet, USB, and power connections, allowing users to quickly connect to other systems and networks. ELECTROGLAS 4090u is a reliable, efficient and cost-effective prober choice for semiconductor device test and development.
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