Used ELECTROGLAS / EG 4090u #293606472 for sale
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ID: 293606472
Wafer Size: 6"-8"
Wafer prober, 6"-8"
Standard chuck
Ambient temperature.
ELECTROGLAS / EG 4090u prober is a machine that is designed to perform probing and testing operations in the manufacture of semiconductor chips. This equipment is used to detect and locate shorts, open circuits, solderbridges, and other irregularities in semiconductor chips. It is capable of probing 3,500 wafers per hour and testing up to 256 pins. The prober features a custom-built linear scanning stage that enables uniform movement of the targets across the needle pitch area and ensures that the probe needles move in a controlled way along the pitch area. The probes are configured to contact any probe pads that are presented to the needles and accurately identify potentially faulty pads in the semiconductor chips. The prober also features a multi-zone beam stepper that facilitates wafer handling and move the system accurately and with repeatable precision in a 3-dimensional space. The machine also features a fully automated probe needle cassette exchange system that allows for easy swapping of the needle configurations. The needle exchange system and automated brake setting can both be adjusted by the user to maximize the machine's performance. The software packages provided with the prober are designed to help the user in controlling the prober, calibrating the probes, setting up recipes, and producing test reports. The prober also contains onboard diagnostics so that any operational issues can be identified quickly. The prober is designed with safety and environmental measures in mind. The machine's design and features are aimed to minimize the risk of operator injury by minimizing high current pathways. The prober is ISO 14001 and SEMI certified, meaning that it meets the highest performance levels for quality and safety in the semiconductor industry. EG 4090u prober is a leading machine in the semiconductor testing and probing industry. It is reliable, efficient, and accurate and it is designed to reduce the risk of operator injury. It is reliable, efficient, and user friendly and it is an ideal choice for testing and probing operations in the semiconductor industry.
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