Used ELECTROGLAS / EG 4090u+ #293606499 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u+
ID: 293606499
Wafer Size: 6"-8"
Prober, 6"-8" Standard chuck Ambient temperature.
ELECTROGLAS / EG 4090u+ is a prober designed for use in semiconductor testing and failure analysis. It is capable of probing complex layouts such as multi-chip modules and fine pitch integrated circuits. EG 4090 U+ prober offers a variety of features that make probing and testing faster and easier than ever before. The prober is equipped with a powerful computer, software and hardware that enables precise, accurate and fast probing. The high speed movement of the moving parts is enabled by the X-Y-Z axes, allowing multiple wafers to be scanned and probed in a faster rate than their counterparts. Additionally, ELECTROGLAS EG4090U+ incorporates a fast and efficient data transfer interface with advanced logic control and high-resolution probe tip control, providing the user with the tools necessary for precise and accurate probing. EG 4090u+ is capable of probing and testing a variety of components and technology nodes at high speeds, reducing the time needed to complete each test and probe process. With its Automation Suite, high speed scanning pathways and algorithms, this prober is designed to allow users to extract high quality test results and perform precise probing efficiently. ELECTROGLAS 4090u+ has a variety of features that contribute to its accuracy and speed such as advanced visioning, ultra-precision probe tips and high-resolution vision sensors. Additionally, the prober features advanced logic control, high speed data transfer and quick probing capabilities. These features contribute to obtaining reliable results and quick testing. The prober is designed with software for easy navigation and control to access test parameters as well as a user-friendly user interface which offers easy access to test and probing data. ELECTROGLAS 4090 U+ is capable of probing, testing, and diagnosing multiple technologies from a variety of devices. Its versatile design and reliable operation allow for testing in a variety of components and devices. Additionally, this prober provides the latest technologies from EG, bringing advanced levels of probing and testing to complex device types. EG EG4090U+ is a powerful and reliable prober for semiconductor testing and failure analysis. Its high speed action and versatile software combine to provide users with precise, accurate and efficient testing and probing processes. The integrated features and high resolution sensors make this prober a must-have for any research and development laboratory.
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