Used ELECTROGLAS / EG 4090u #293606503 for sale

ELECTROGLAS / EG 4090u is a professional high accuracy prober with both standalone and automated probing capabilities. It offers high-resolution profiling of various device types, such as integrated circuit, discrete and bare board. This prober provides excellent repeatability, translating to high-accuracy performance and high throughput. EG 4090u prober features a low-vibration high-speed planar scanning motion. It provides efficient, accurate, and repeatable measurement of substrate and device features with consistently high accuracy and precision that's ideal for integrated circuit development and analysis. ELECTROGLAS 4090 U can probe multiple device sizes, from fine-pitch IC to up to 12" devices with a minimum achievable size of 1 mil trace, pad and space and can also probe up to 0.5 mil gap using minimum gap frequency technique. The lightweight and rigid structure of ELECTROGLAS 4090u prober allows for high precision wafer probing, with a repeatability better than 10 microns. ELECTROGLAS / EG 4090 U prober has many advanced features. It has a universal prober transport equipment and compatible prober fixtures. It supports C-Axis rotation, offering complete 360 degree semiconductor device coverage. The C-Axis also offers "diagonal" probing for short trace measurements such as ball grid array and package-on-package device types. The amine-resistant stainless steel overlay table used in both manual and automated modes helps ensure bias control when measuring to ensure precision. The system supports various automated tests, from standard semiconductor tests to antenna analysis. 4090 U prober can be used for various applications including failure analysis, production monitoring, and production testing. The unit also supports a variety of test systems, such as network analyzers, vector network analyzers, impedance meters, and curve tracers. Overall, 4090u is a high-performance prober that enables high-accuracy wafer profiling in a variety of substrate and device types. Its low-vibration planar scanning motion ensures high repeatability and low-noise performance. The prober's advanced features include a unique universal prober transport machine, C-Axis rotation, and amine-resistant stainless steel overlay table for optimal precision. With its excellent accuracy, repeatability, and capability, EG 4090 U prober can be used for a range of applications.