Used ELECTROGLAS / EG 4090u #293606667 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 293606667
Wafer Size: 6"-8"
Prober, 6"-8" Standard chuck Ambient temperature.
ELECTROGLAS / EG 4090u is an advanced semiconductor prober designed for testing and analyzing a wide range of integrated circuits (ICs). It utilizes a high-resolution, high-speed, 12.5μm pitch, capacitive measurement system with sophisticated software-driven wafer probing capability. EG 4090u has up to eight microscope objectives for automated zooming and for rapid alignment of the test circuitry. The unit also has six independent stage positioning motors for precise manipulation and alignment of the sample being tested. With the use of specialized software and hardware tools, ELECTROGLAS 4090 U is capable of performing a wide range of tests, ranging from basic parametric measurements, to detailed electrical characterization, to physical measurements. ELECTROGLAS / EG 4090 U's integrated circuitry diagnostics consist of efficient, comprehensive electrical testing techniques, such as wafer probe loop testing, and active and passive wire-bonding. The unit also features digitizers that are sensitive enough to identify micro-level fluctuations and faults in the ICs. Moreover, the unit includes a complete software suite that offers a wide range of debugging tools, such as a logic analyzer, system simulator, and a emulator for the IC. The machine's analysis software also has the capacity to visualize and control the probing profile in real time. ELECTROGLAS 4090u's scanning head integrates a variety of probes and sensors to ensure accurate and reliable performance. The unit is equipped with a high-resolution charge-coupled device (CCD) camera for clear visual monitoring of the sample being tested. This camera offers a large range of zoom magnification capabilities, from 10x to 16x. The unit also has a multi-zone thermal system for probing sensitive devices, with a measuring range from 200 degrees Celsius (°C) to 975°C. 4090u is a powerful, highly integrated tool for testing, debugging, and analyzing complex integrated circuits. The well thought-out design of this prober provides advanced functionality and a high-quality working environment. Coupled with the critical software tools at its disposal, this unit offers a comprehensive testing solution for semiconductor designers, device engineers and researchers alike.
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