Used ELECTROGLAS / EG 4090u #293606683 for sale

ELECTROGLAS / EG 4090u is a modular semiconductor prober designed to cater to the testing and analysis requirements of a wide range of semiconductor devices such as transistors, diodes, and integrated circuits. The prober boasts a range of features designed to make it one of the most sophisticated probers on the market. The prober utilizes an advanced air-bearing platform which ensures smooth and precise motion across the wafers. This motion is enabled through an open architecture with a highly-customizable design that allows the user to make the most out of the prober. EG 4090u includes various configurations for total specialization. The microscope mount allows for high-magnification visual inspection, as well as surface and subsurface imaging, to study complex processes. The essential sensing components of the equipment are the capacitive transducers and laser interferometers. Both are responsible for collecting high-precision surface data points, with each channel carrying up to four capacitive transducers and two laser interferometers. The prober's advanced data logging system ensures that all of the information is available for template creation and comparison, allowing the user to create the most accurate testing and analysis results. The prober comes with an intuitive user interface, allowing the user to easily enter parameters, retrieve analyzed data, and adjust test algorithms with minimal effort. This enables fast and efficient operation in order to maximize throughput rates. Additionally, the unit's advanced Probing and Analysis Algorithms (PAAs) help to improve the accuracy and precision of testing and analysis results. These algorithms include Data Acquisition Feedback (DAF), Simulation of Uncontainable Structures (SUS), and Automatic Probing and Analysis (APA). ELECTROGLAS 4090 U is capable of working with various automation and touchless wafer-handling systems, allowing for full integration with production lines for continuous production and analysis of batches of wafers. The prober is also equipped with a secure fab environment, safeguarding information within its network. The machine also carries a robust suite of safety features, from an operator access tool to asset-wide safety circuitries. Overall, EG 4090 U is a highly customizable, multi-functional semiconductor prober that can satisfy a wide array of requirements while ensuring the safety of its users. The features of the prober make it ideal for precise and reliable testing and analysis of semiconductor devices.