Used ELECTROGLAS / EG 4090u+ #293753204 for sale

ELECTROGLAS / EG 4090u+ is an advanced prober designed for high-performance wafer probing and fault localization in semiconductor fabrication. The prober is equipped with a fully-automated, 200 mm x 200 mm chuck and a 5-axis motorized arm designed for gliding over the top surface of a device. This allows for highly precise and repeatable probes to be performed. The 5-axis motorized arm can also be used to precisely adjust the chuck's travel speed and position, as well as its scalability, in order to optimize probe performance. The prober is capable of handling wafer sizes up to 8-inch, which facilitates probing and testing of multiple wafers of varying sizes. It can also be used for wafer alignment and wafer orientation. In addition to the automated arm, the prober also includes a wide range of tools designed to maximize productivity, such as an integrated autofocus process, a high-speed autotilt feature, a powerful force detection system and an intuitive user interface. The integrated autofocus process allows the operator to quickly and accurately focus the prober on the desired point of the sample. The high-speed autotilt feature can be used to adjust the angle of the sample in order to accommodate different types of probes or test points. The force detection system allows the operator to accurately measure and record probe pressure. The intuitive user interface includes real-time monitor displays, a library of probing sequences, and on-screen reports to help the operator quickly identify issues, ensure quality operation, and increase productivity. The prober is also equipped with a range of diagnostic and calibration capabilities to ensure consistent, reliable probe performance over time. The diagnostic options include on-board diagnostics, diagnostic probes, and measured frequency sweeps. The calibration capabilities include trigger offset, z-axis tracking and wafer mapping for fine tuning the probe positioning capabilities. To ensure safety, the prober is designed with multiple interlocks to protect against unexpected power surges or other anomalies. In addition, the prober is equipped with network and security features to ensure that data is safely transmitted, stored and accessed securely. EG 4090 U+ is an advanced prober designed for high-performance wafer probing and fault localization in semiconductor fabrication. It is equipped with an automated arm, a wide range of tools, an integrated autofocus process, a high-speed autotilt feature, a powerful force detection system, and an intuitive user interface. It also includes a range of diagnostic and calibration capabilities, as well as multiple interlocks and network and security features to ensure safety and data security.