Used ELECTROGLAS / EG 4090u #293767773 for sale

ELECTROGLAS / EG 4090u Prober is a fully automated, high-speed, multi-function prober with a modular architecture that provides high-level performance and flexibility. It is designed to accurately characterize a variety of components and technologies. This Prober can be used in single wafer applications, as well as in multiple wafer parallel testing. EG 4090u Prober includes an integrated heater, precision placement stages, and an ultra-wide video microscope equipment. It is powered by an Electric Field Ejection (EFE) system that allows low voltage/high current contact assembly and fast contact activation. This unit helps in ensuring reliable and stable contact performance and is capable of testing up to 65 different modules per run. The Prober's CCD cameras possess the highest image resolution with scans of up to 25 million pixels per frame. In addition, the integrated laser aligner detects and corrects for misalignment to ensure alignment accuracies of ±0.5 mil. The Prober also features a pin repeatability of ±3 µm, and a die placement accuracy with a 12-die mark-to-mark tolerance of ±12 µm. ELECTROGLAS 4090 U Prober automates manual processes and eliminates the need for human judgment and intervention. It provides enhanced and efficient measurement for components, as well as higher throughputs by running multiple iterations of the same test. The Prober also carries out real-time performance monitoring cycles to ensure optimal performance. The Prober is also equipped with multiple software protocols in a user-friendly interface so that users can program, monitor and control the prober with one PC. These protocols include automated motion control, product specific software, and fully integrated test cell management. This machine is also capable of rapid, accurate results in challenging test environments, such as high-multi-site configurations. EG 4090 U Prober is an advanced yet user-friendly, high-performance tool that offers precise operation, unrivaled speed and accuracy, and efficient operation for a variety of testing needs. Its versatility, ease of use and innovative features make it an ideal solution for the testing and characterization of electronic components,including MEMS and semiconductors.