Used ELECTROGLAS / EG 4090u #293767853 for sale

ELECTROGLAS / EG 4090u is a prober used in semiconductor production and development. It is designed to test semiconductor devices and circuits, primarily those built using advanced silicon technologies, such as SOI (silicon-on-insulator) for high density, and 3D STI (shallow trench isolation). This state-of-the-art prober features a compact footprint and a robust 6-axis wafer stage and provides a unique hybrid combination of high accuracy optically scanning and inertial scanning mode, providing high-speed device test and characterization from wafer-level to sub-micron level. EG 4090u is a dual-mode prober featuring an advanced motion control equipment for high-precision and high-speed motion over a wide range of tasks. The motion system allows for multiple passes over the same area, with a maximum velocity of up to 2m/s and a maximum acceleration of 25g. High accuracy positioning is accomplished using piezo sensors and a linear encoder array with a resolution of one micron. The prober also features a wafer stage with flexure-held X-Y-Theta axes that have a total movement range of ±10mm in each direction, while allowing ultra-low offset errors. The wafer stage can be used for probing in various environments, such as a standard cleanroom, a cryogenic vacuum chamber, or a helium glove box. Additionally, ELECTROGLAS 4090 U comes with an advanced vision unit for multipoint alignment for consistent and repeatable probing. The prober is powered by an industry-leading Windows-based user interface which is integrated with powerful device-centric probing and software development tools. The software allows for automated probing, workflow customization, and programmatic integration with external platforms and databases. The prober also features a high-end probing machine with a choice of six e-Beam or cantilever probe cards. This tool is optimized for highest accuracy and repeatability and is suitable for a wide range of probing requirements. Overall, 4090u is an advanced prober designed to meet the needs of modern semiconductor production and test operations. It offers high accuracy and repeatability with fast, versatile probing capabilities matched by its robust motion control asset, high-end software tools, and choice of e-Beam or cantilever probe cards. Thanks to its small footprint and integration with external platforms, it is suitable for in-line production as well as design and characterization work.