Used ELECTROGLAS / EG 4090u+ #293807416 for sale

ELECTROGLAS / EG 4090u+ Prober is a highly advanced wafer testing equipment built to meet high-end industrial semiconductor manufacturing and testing needs. The prober is capable of processing a wide range of wafer sizes up to 33mm diameter. It is designed to provide an exceptional degree of accuracy and repeatability for testing highly complex and sensitive devices. EG 4090 U+ Prober features a rapid, contactless wafer handling system that supports the loading and unloading of multiple wafers in a single operation. The wafer exchange unit uses vacuum wafer chucks and a robotic wafer transfer machine, so that wafers can be rapidly loaded and unloaded without exposing them to environmental contaminants. The tool also features a high-speed, high resolution motion asset that allows for up to 12 axes of movement. This enables the model to accurately position probes down to 0.25 microns and allows for faster, higher quality testing. The motion controller features real time commands for velocity, acceleration, jerking and cornering to minimize errors. ELECTROGLAS EG4090U+ Prober also has a range of advanced features to provide detailed test data. This includes a peak-hold feature which can detect small changes in voltage, which is useful for testing analog circuits. There is also a leakage current detection equipment for testing memory cells and an optical light filtering system for high precision data capture. The electromatic testing unit is also highly configurable, allowing users to configure it for a variety of testing and measurement applications. A range of prober accessories are available, such as different probes, probes for vertical access and probes with temperature compensation. EG4090U+ Prober is an invaluable tool for advanced semiconductor testing and manufacturing. With its outstanding accuracy and repeatability, combined with an array of advanced features, this prober provides incredible performance and reliability for even the most demanding industrial testing requirements.