Used ELECTROGLAS / EG 4090u+ #9151078 for sale
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ID: 9151078
Prober
Thin wafer upgrade
BIOS version: 10.0.2.2G
OS: Windows 2000
EGCommander: 9.2.1SP5
Profile head: NCES
Hot chuck
DPS2 camera
Bridge Camera: N type
Transfer arm: normal wafer
Spindle type: thin wafer
Work Z range: 200-500 mil
MH version: P029
Pad type (clean unit): reg scrub
Power: 1 phase, 115 V
Currently installed.
ELECTROGLAS / EG 4090u+ is a tool used to test microelectronic assemblies and wafers. It is a multi-functional wafer prober that combines high-level automation with its patented 3D motion technology, making it easy to program and operate. Able to be set up to automatically run a variety of different test and diagnostic operations on test substrates, EG 4090 U+ is a valuable testing asset for any laboratory or production testing environment. ELECTROGLAS EG4090U+ uses its high-speed 3D motion technology to provide precise positioning across the x, y, and θ axes of the substrate, allowing accurate testing results. The equipment's three-dimensional (3D) motion technology can move the test head within a 45° x 45° range at up to 230mm of speed for faster testing operations. It also features advanced automation control technology that can be programmed to optimize various test operations. The automated system makes probe placement, sample changing, data collection, and test switching faster and more efficient. In addition to the standard 3D motion technology and automation control features, ELECTROGLAS / EG EG4090U+ can also be configured for other applications. It comes with two software options, ProbeXPTM and EGViewTM, which provide powerful features for characterizing wafers, semiconductor device testing, failure analysis, and yield monitoring. ProbeXPTM allows for on-wafer testing, data acquisition and image capture, as well as code editing and programming. EGViewTM provides users with real-time processing, visualization, and analysis of test results. Additional features of EG 4090u+ include its auto- positioning capability, which can automatically position the probe on the wafer; an integrated vision unit to detect the substrate's position; a user-friendly Windows user interface for intuitive operation; multiple communication interfaces for integration with external systems; a variety of wafer handling options; and a customizable design that allows users to tailor the machine to their testing and application requirements. Overall, 4090u+ is a highly versatile and reliable wafer prober. With its advanced 3D motion technology, automation control features, integrated software options, and customizable design, it is an ideal solution for performing various testing and diagnostic operations on test substrates.
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