Used ELECTROGLAS / EG 4090u+ #9203484 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u+
ID: 9203484
Wafer prober With cold chuck EGC 9.2.2 Golden hot chuck, 8" DPS3 CPCS2 AVS Large scrub pad block Thin wafer handling option Operating system: Windows 2000 PSMG Power supply.
ELECTROGLAS / EG 4090u+ is a multi-purpose automated prober designed for a wide range of applications in the wafer testing industry. It is a state-of-the-art prober featuring a multi-axis equipment, high-speed productivity, and a fully programmable testing system. EG 4090 U+ features a powerful multi-axis unit with a programmable high-precision kinematics platform, XYZTip/Tuck, and G-Force flexure assemblies which allow for precise and reliable probing. The multi-axis machine, combined with a high-speed multi-component motor, enables ELECTROGLAS EG4090U+ to move quickly between test points while guaranteeing high positional accuracy. 4090 U+ offers a robust tool architecture that supports high-speed I/O, wide measuring range, flexible configuration, and is compatible with a variety of control software platforms. The integrated Prober Server Controller (PSC) provides real-time feedback, allowing the user to quickly and accurately identify and eliminate any testing errors. In addition, EG4090U+ supports a wide range of production tests, including wafer-level burn-in, packaged device electrical tests, and collateral stress tests, as well as process monitoring and software testing. The prober also boasts a flexible environment with interchangeable chuck sub-assemblies for wafer sizes form 2" up to 8". The integrated proprietary ElectroSmart asset, designed to ensure unit-to-unit consistency, provides all the features necessary for high-speed production testing, such as an expandable memory capacity and a fully programmable logic model. ELECTROGLAS / EG EG4090U+ is also designed for reliability and operator safety, utilizing a forced airflow equipment to control temperature and prevent dust, as well as an integrated prober safety network that prevents accidental damage to samples and parts. The unit also features First Pass Yield (FPY) and automatic wafer mapping to reduce production time, increase accuracy, and maximize test results. Overall, EG EG4090U+ is a cutting-edge automated prober that provides industry-leading performance, speed, flexibility, and reliability for a wide range of testing applications.
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