Used ELECTROGLAS / EG 4090u #9205869 for sale

ELECTROGLAS / EG 4090u is a high precision prober used in the semiconductor industry for high resolution wafer inspection. It has a high speed open-loop servo-drive equipment with coupled motion for high precision scanning and positioning. It has a fully enclosed six-axis motion system with accelerometer and encoder feedback for greater accuracy and uniformity. EG 4090u is capable of working with substrates up to 200mm in size and has a maximum probing height of 75mm. The proboscope of ELECTROGLAS 4090 U has a maximum magnification of 1000x with a resolution up to 0.83nm. It has an integrated illumination unit which provides brightfield, darkfield, and variable contrast images. It also features a unique high intensity focusing machine which stabilizes the image during scan and navigation. The microscope tool is capable of accommodating a large range of probing accessories, including an incident light source for fluorescence imaging. 4090u also features an advanced surface profiling asset. It employs optical interferometry for characterizing surface topography of symmetric and asymmetric topographies. It has a high temporal resolution which allows for measurements of thermo-mechanical surface properties and quantitive mapping of contact pad geometries. ELECTROGLAS 4090u is also equipped with an electrostatic chucking model for secure sample holder mounting. The force applied for chucking and dechucking is user defined. The sample holder is reverse compatible with SEMI standards, including E99.1 and E130. 4090 U is compatible with a broad range of third-party automation systems and software packages. This provides users with greater flexibility for integration and compatibility with existing systems. In addition, it supports a range of form factor standards such as SEMI-ATL, SEMI-PSR/GAT and SEMI-MOS. ELECTROGLAS / EG 4090 U prober is an advanced and highly precise wafer inspection tool that supports the most recent standards and automation solutions. The combination of its high resolution probing, optical interferometry, and electrostatic chuck make it an ideal choice for many semiconductor manufacturing applications.