Used ELECTROGLAS / EG 4090u #9206268 for sale

ELECTROGLAS / EG 4090u is a high-end prober designed for semiconductor testing and probing. It combines a high resolution scanning electron microscope (SEM) and an automatic prober in one compact unit. EG 4090u prober is equipped with six controllable axes and capable of testing devices up to 300mm in size. It has a scanning stage speed of up to 400mm/s and is capable of scanning at resolutions up to 5μm in both planar and vertical directions. The prober's lightweight body ensures fast and controlled probing processes. This prober is ideal for specialized tests with its built-in automated prober control system, allowing easy and accurate control of the tool. It is also capable of testing flip chip, ball grid array (BGA) and complex package devices. ELECTROGLAS 4090 U is also equipped with an automated reticle stage, capable of swapping out reticles quickly and easily without sacrificing accuracy. The prober is equipped with an efficient heating system, allowing users to perform high-temperature tests up to 200°C. Its precision thermal control feature provides excellent temperature stability, allowing users to perform high-quality tests quickly and accurately. In addition, the prober is also compatible with defect local placement (DLP) systems for high-precision 3D defect localization. Its advanced image processing capabilities allow users to quickly and reliably detect, classify, and correct circuit defects. EG 4090 U also supports data exchanges with external peripherals such as CAD systems, enabling users to quickly and accurately analyze test results and upload data for further analysis. Overall, 4090 U is a high-performance tool designed for specialized semiconductor testing and probing. Its combination of scanning electron microscopy, automated prober control, and efficient temperature control make it an excellent choice for high-precision, high-quality tests.