Used ELECTROGLAS / EG 4090u+ #9221259 for sale

ELECTROGLAS / EG 4090u+ is a precision prober designed specifically for semiconductor wafer testing. It uses semiconductor-specific features to accurately and quickly measure a variety of electrical parameters with increased throughput. It uses a high frequency, dynamometer-controlled, backside-locking mechanism to firmly secure and precisely position the wafer to the chuck. This makes it possible to measure wafers up to-300mm in diameter with accuracy. The prober also has an adjustable chuck for wafer size adjustments and a center-loading mechanism that allows for hands free substitution of wafers. This gives it the ability to quickly mount and unmount wafers, allowing for quick changes from one to another. EG 4090 U+ has a proprietary, highly intuitive user interface. This interface provides clear and detailed information on equipment functions, such as wafer size, test type, and probe card information. Additionally, it is capable of executing a variety of test sequences with minimal setup, so that testing can be performed quickly and efficiently. ELECTROGLAS EG4090U+ also has a powerful, Diamond-grade CCD vision system. This allows for the precise alignment of wafers, even when the wafers are warped or irregularly shaped. This reduces the amount of mis-alignment and increases throughput. It also has a high-resolution scanning unit that can be used to capture minute details on the wafer, such as contacts and wires. Finally, 4090 U+ has a comprehensive thermal management machine that keeps the machine cool during extended testing cycles. This is accomplished with a combination of air and water cooling systems, which keeps the prober at optimal temperatures even during extended periods of activity. In summary, EG4090U+ is a highly versatile and efficient prober with a variety of features that make it ideal for the testing of semiconductor wafers. It is capable of quickly measuring electrical parameters with a high degree of accuracy, and has an intuitive user interface that makes setup and testing fast and efficient. It also has a high-resolution scanning tool and a comprehensive thermal management asset that ensures optimal temperatures are maintained during testing, allowing the prober to operate at peak performance.