Used ELECTROGLAS / EG 4090u #9234984 for sale
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ID: 9234984
Prober
Chuck type: Hot chuck
Ambient temperature: Up to 130°C
Chuck assy: Gold
Operating system: MS-DOS
Utilities supply:
CDA: House air 80 to 90 psi
Vacuum: 22-26 in Hg
Chuck-top with forcer (Gold)
Control panel (Joystick assy)
Pre-aligner assy
T-Arm assy
Indexer assy
Base pneumatic assy
A6 and A13
Optics bridge camera controller unit
Missing parts / Fault parts:
Assembly: EG Monitor
Power supply
MHCM Boards
DCM Motherboard
Dar boards in PCM
Hard Disk Drive (HDD) and Floppy Disk Drive (FDD)
VM Vision box
Power supply: 200/230V.
ELECTROGLAS / EG 4090u prober is a high-precision wafer test equipment component used in semiconductor fabrication processes. It has been designed to reliably handle a wide array of wafers and substrates in production test, engineering development and failure analysis applications. It has the capability to reach full-contact measuring accuracy, providing quick and accurate measurements of parameters such as die dimensions, thin-film resistivity, capillaries and other features. EG 4090u prober has a control system built-in, allowing the user to control the probe's position and velocity, as well as all automated functions. With a capacity of up to 150 wafers, the prober can easily cover the needs of multiple applications. There is also the ability to use different configurations of prober components, including multiple stages, temperature control, aligners, loaders, unloaders and other optional accessories. Additionally, the prober includes a library of factory-loaded or user-defined test programs, providing reliable and efficient testing of a wide spectrum of device types. The prober features a vertical, stable traverse motion. With up to 300 mm/s traverse velocity, it can rapidly assess a wide range of wafer parameters accurately and quickly. Additionally, the prober is equipped with a high-resolution vertical z-stage allowing a vertical range up to 1.3 mm and a fast z-travel to 200 μm. Its z-stage accuracy is 3 μm and z-repeatability is 1 μm. ELECTROGLAS 4090 U prober also utilizes high-resolution motion and measurement feedback systems to ensure precise and repeatable contact analysis. Its auto-alignment feature ensures that the probe tip is on target every time. The prober is equipped with a 7-axis gapless stage for precise, repeatable movements and it has a built-in camera for visualization of contact results. EG 4090 U prober has a robust, durable design and is suitable for use in the most demanding production environments. It is compliant with industry standards for maximum quality assurance, performance and reliability. It is also backed by comprehensive service and support services that are available for maintenance and repair if needed.
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