Used ELECTROGLAS / EG 4090u #9244440 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 9244440
Vintage: 2002
Prober AVS Upgraded ELO Touch screen monitor, 15" HP 4062 Air drive manipulator Small cleaning block ELECTROGLAS OCR TEMPTRONIC Air cool chuck Network capability enabled 2002 vintage.
ELECTROGLAS / EG 4090u is a prober designed for ultra-high speed testing of integrated circuits. It is a general-purpose wafer prober designed to be used in research and development (R&D) laboratories. The main features of EG 4090u include a large number of measurement points, with up to 1,000 separate contact points per pad. It has parallelism overscanning, which allows for very precise alignment of the probing needle with the chip pad. The tool also has a fast program count, which allows it to quickly move between probe points, while avoiding potential collisions; this helps ensure reliable performance. The operating software of ELECTROGLAS 4090 U is designed for flexible and rapid equipment reconfiguration. This allows engineers to create and modify test programs quickly, providing improved test coverage and speed. The machine also has a capacitive timing system which increases the accuracy of the measurement and reduces the margin of error. EG 4090 U also has an automated wafer handling unit, which simplifies wafer loading and unloading. The prober also features an auto-calibration feature that ensures accuracy. It has an in-situ mechanical alignment machine which enables it to precisely align both wafer and probe cards without having to reset the tool. 4090u also includes integrated RF measurement capabilities. With this feature, testing of devices with RF input and output, such as cellular phones and wireless LANs can also be handled. Finally, ELECTROGLAS / EG 4090 U has a very high level of accuracy and repeatability. It has a high-resolution, ultra-low-noise capacitive probe card, which ensures consistently accurate measurements. And with its high-precision wafer holder, the tool can ensure precise alignment of the wafer and probe cards every time.
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