Used ELECTROGLAS / EG 4090u #9246352 for sale

ELECTROGLAS / EG 4090u is an advanced prober designed to meet the needs of high-volume wafer testing. This ultra-high precision prober features a unique probe design, optical zooming, and other advanced features intended to increase both yield and quality. EG 4090u probes feature an advanced design that permits extreme precision. The special openings on the tips of each probe allow for miniscule contact between the probe and the sample surface, which allows for incredibly accurate measurements. This design also reduces the wear on the probe over time. Additionally, the probes are coated with a material that minimizes surface resistance and ensures proper contact between the probe and the sample. The advanced optical zoom capabilities of ELECTROGLAS 4090 U allow for incredible accuracy and repeatability in wafer probing. The zoom capability allows for precise point-to-point distance measurement and reduces the need for stitching. This ultimately increases the accuracy of sampling and eliminates the need for multiple passes over the same area. EG 4090 U has an impressive maximum measurement rate of 3,000 points per second, ensuring that samples can be tested quickly and efficiently. Additionally, the prober is equipped with a unique End of Scan Monitored Interrupt (ESMI), which automatically stops the scan when a sample fails. This helps to eliminate false positive results and ensures accurate readings. ELECTROGLAS 4090u is a powerful and precise tool for high-volume wafer testing. Its advanced probe design, optical zoom capabilities, high accuracy rate, and EOMI scan interruption help ensure accuracy and efficiency in wafer probing. 4090u is an ideal solution for any enterprise requiring intense wafer testing.