Used ELECTROGLAS / EG 4090u #9252927 for sale

ELECTROGLAS / EG 4090u prober is a fully automated test station that is designed to measure the electrical characteristics of semiconductor wafers and other devices. This testing device is capable of testing both bare and fully-assembled devices, and it is designed to make testing setups and measurements faster and more efficient. EG 4090u is equipped with an ultra-high resolution, high speed Digital Imaging System (DIS) that gives it the ability to accurately detect and measure electrical characteristics on even the smallest semiconductor devices. This DIS features an array of lenses, as well as a high-resolution Charge-Coupled Device (CCD) that magnifies and records electrical signals. This technology helps the prober to measure the fine details of the devices' electrical performance. ELECTROGLAS 4090 U is also designed to minimize contact-time between the test needles and the device being tested. This reduces the risk of damage to the device from wear and tear. Additionally, the prober utilizes Vacuum/Fluidic Compensation for better performance in a high-humidity environment. This technology ensures that the device's electrical performance is not affected by the surrounding atmosphere. 4090u is a highly precise and reliable testing device that can handle testing jobs with varying levels of complexity. It is capable of performing tests and measurements on both large and small wafers, as well as devices with a range of technologies, including MEMS, RF, CMOS, and optical sensors. The prober is also equipped with a built-in library of test-templates, as well as the ability to save test parameters and results for use in the future. In addition to the prober's automated testing capabilities, 4090 U also features an easy-to-use user interface that enables operators to quickly configure their testing parameters. This includes the ability to set up customized test sequences and measurement grids for more control over the testing process. The prober also features a range of diagnostic tools for troubleshooting, as well as the ability to export and import data for further analysis. Overall, EG 4090 U is a powerful and reliable testing device with the capabilities to measure even the smallest semiconductor devices. Its advanced Digital Imaging System and Vacuum/Fluidic Compensation prove invaluable in accurately and reliably testing devices in any environment. With its built-in library of test-templates, advanced user interface, and data export/import capabilities, this prober can ensure that the testing process is efficient and productive.