Used ELECTROGLAS / EG 4090u #9267371 for sale

ELECTROGLAS / EG 4090u Prober is a highly versatile automatic prober designed for wafer probing. It is designed for use in production testing, wafer level burn-in and other hi-rel testing. EG 4090u provides fast and accurate board assembly probing, logging and prototying. ELECTROGLAS 4090 U prober provides features such as high speed probing, high-accuracy, multiple chip probing, multi-axis control, automatic parametrization for complex layouts, pressure controlled probing, auto-retract facility and an ergonomic design. The unit has a base plate for controlling probe tip contact pressure and a TestProbe Rack for easy loading and unloading of test probes. It also provides a precision test area along with a patented transport mechanism for high speed probing and handling. 4090u is designed for high-volume automated production testing which offers faster testing of prototyped complex layout. The prober has two correction axes, X-Y movement along with Z-Delta, plus optionally a F-Theta axis for manual corrections. The device has a retractable body for soft contact and uses a pressure controlled probing system to ensure accurate contact of the probes. 4090 U Prober is programmed in a lab environment and has a file-based interface, where test program pin list is loaded from a disk drive.The unit has multiple programming options like W+G Test System Software, Windows based GUI software with an Excel link or workbook coding. EG 4090 U Prober is equipped with a color CCD camera for inspection and logging, with optional stage rotation which uses a rotary encoder. The unit is also mounted with two 22" flat panel displays that are used for viewing test results. ELECTROGLAS 4090u is a powerful and versatile prober that is built to provide accurate and fast prober tests. It has a number of features that enable it to be used for a variety of testing and probing purposes. The unit's flexible design, ergonomic test stands and the CCD camera enables the prober to meet the demands of production testing, wafer burn-in testing, and other high-reliability tests.