Used ELECTROGLAS / EG 4090u #9267372 for sale

ELECTROGLAS / EG 4090u is a prober equipment designed to enable accurate and precise testing of semiconductor devices, wafers, and components. The prober features an internal probing system consisting of a double-stage feed forward unit for accurately pinpointing probe needles. It has a patented needle-tip exchange machine that enables a clean changing of probe needles which yields very reliable results. This tool is also equipped with two digital cameras with built-in auto-adjusting feature and four-way media alignment for quick alignment of media when loading a cassette. EG 4090u features an algorithm-controlled motion asset to increase accuracy on all test moves. The motion model is made with direct-drive linear motors coupled with zero backlash transmissions and is capable of 200,000mm/min. speeds. The prober also offers a new touchscreen user interface which allows for precise real-time adjustments and movement of the needle, large user-defined mapping functions, and an integrated data acquisition equipment. The prober has a wide range of test capabilities including high frequency, digital memory, analog and logic component characterization, and flat panel device testing. It is equipped with a Versatile Tester adaptor (VTA) interface to rapidly change between various wafer tester kits. The electrically insulated wafer probe card area of the prober can hold up to 16 wafer probe cards, enabling a variety of wafer probing options. It has a lightweight, energy efficient, modular chassis design which minimizes system maintenances costs. The unit also utilizes multi-stage wafer probing methods to reduce probe damage. ELECTROGLAS 4090 U prober has proven reliability and cost effectiveness. Its operation is made simple with its touchscreen interface and automated functions, which minimizes operator involvement and reduces set up time. Finally, the prober offers a flexible transport and handling machine, featuring a palletizing pickup and delivery tool to reduce loading and unloading times. All of these features make it an ideal prober for semiconductor testing.