Used ELECTROGLAS / EG 4090u #9282309 for sale

ELECTROGLAS / EG 4090u prober is an advanced semiconductor testing equipment designed to rapidly and accurately test a wide variety of chip designs. The system uses a sophisticated dark-field optical microscopy technique to measure electrical properties such as electrical resistivity, capacitance, and leakage. This unit provides the capability to test multiple chips simultaneously at extremely high speeds, allowing for the comprehensive testing of high pin count samples. The prober contains a number of integrated subsystems including an alignment subsystem, a capacitance measurement subsystem, a real-time data acquisition subsystem and a semiconductor parameter characterization subsystem. An accurate and repeatable position sensing device ensures that the sample under test is positioned accurately with respect to the prober's optical imaging elements. A capacitance measurement subsystem contains a capacitance-voltage probe and a high-speed digital inductance analyzer. A real-time data acquisition subsystem allows for the simultaneous capture of both capacitance and leakage data. The semiconductor parameter characterization subsystem is capable of sampling a wide range of parameter ranges with 8-bit resolution and offers advanced statistical analysis abilities. The prober has a number of benefits over traditional testing methods. The machine is capable of extremely fast testing of multiple chips simultaneously, allowing for testing that is nearly impossible to achieve with manual testing methods. Additionally, the tool offers high-accuracy measurements over a wide range of parameters. This makes it the ideal asset for production environments where repeatability and reliability are paramount. Overall, EG 4090u prober is an advanced, high-speed semiconductor testing model that provides accurate and reliable results. With its multiple integrated subsystems, advanced optical imaging elements, and high-speed digital instruments, it is the perfect solution for high-throughput testing applications in a fast-paced production environment.