Used ELECTROGLAS / EG 4090u #9284227 for sale

ELECTROGLAS / EG 4090u is a prober used to test and analyze semiconductor materials. It is designed for electrical probing, probing for capacitance-voltage (CV) characteristics, and probing for optical properties. It is a high-precision and reliable prober, which can scan a 4" samples and has a resolution as high as 0.2 microns. The prober has an innovative technology called 'Scan-Sweep' which allows multiple probe points to be quickly tested and characterized. It can be used to measure parameters such as electrical properties such as currents, capacitances, and resistances; CV measurements such as semiconductor threshold voltage and leakage current; and optical properties such as the refractive index. EG 4090u has a temperature controlled chuck which helps to keep the probe stable in a range of temperatures. The probed device can move to any desired location on the wafer, up to a maximum of 6 mm. The probe used by ELECTROGLAS 4090 U is specifically designed to reduce the capacitive loading on the device under test, which makes it suitable for accurate measurements. The prober also has a digital controller which allows the user to store up to 99 probing programs, and provides for a variety of probing strategies such as parallel testing and sequential testing. The user interface has a large LCD display which provides information about the probe status, notably including the coordinate position of the probes. ELECTROGLAS 4090u provides an automatic measurement control system which monitors, controls, records and saves the probing results, making it easy to maintain a detailed audit trail. The prober is powered by a high throughput computer lane which is capable of running various measurement algorithms. The prober is designed to be compatible with the latest fab measurement technologies such as e-beam, x-ray, and electron microscopy. It can also be used with probing accessories such as Bias/Probe Units, Low Level Contacts, and Magnetic Vacuum Probing systems. Overall, 4090 U is a reliable and precise prober for testing and analyzing semiconductor materials. Its innovative Scan-Sweep technology, high throughput computer lane, digital controller, and automatic measurement control system provide accurate and efficient results.