Used ELECTROGLAS / EG 4090u #9284230 for sale

Manufacturer
ELECTROGLAS / EG
Model
4090u
ID: 9284230
Prober.
ELECTROGLAS / EG 4090u Prober is a high-precision, high-performance testing and probing equipment designed for production test and burn-in applications for semiconductor devices. It is suitable for testing a wide variety of standard and special materials such as wafers, ICs, hybrids, multi-chip modules, and small scale circuits. The prober offers excellent repeatability, low noise levels, fast test speeds, and high probing accuracy. The prober's programmable motion system has a dynamic force control unit and operates with a high acceleration of 10g for precise handling of fragile devices. It supports a wide range of wafers sizes, in sizes from 2 inch to 8 inch, with a throughput of up to 65 wafers per hour. The prober includes an advanced software machine, which facilitates users to quickly program their probing tasks, resulting in rapid set up and operation. It supports a variety of programming languages, such as EGL-P3, C, and Pascal. In addition, it allows users to customize tests, probe parameters, and test samples according to their needs. The prober comes equipped with a 128Mb EGL RAM memory, which enhances its high-speed, data transmission operation. It also offers an extensive range of input/output stations and external equipment for off-line operation. The prober has a special Quantum Tuning Option useful for analyzing waveforms and optimizing test results. It can sense contact tips, providing immediate feedback to ensure closed loop accuracy for high yields. The prober is designed to accommodate a variety of Wafer Transfer Systems. It is also available with an ISO-certified In-line handle catch option, which offers a secure solution for high speed production lines. The tool supports a range of probe cards providing control on voltage, current and other test signals, leading to maximum yield. An intelligent software control helps optimize the use of test resources. Overall, EG 4090u Prober is an excellent and reliable tool for efficient testing of various semiconductor devices. It offers efficient handling of fragile devices, speedy data transmission, and precise probing accuracy.
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