Used ELECTROGLAS / EG 6000 #9182118 for sale

Manufacturer
ELECTROGLAS / EG
Model
6000
ID: 9182118
Vintage: 2005
Wafer prober Nickel hot chuck, 12" Load port Bottom Probe Card Changer (BPCC) ESI OCR PRI Robot and pre-aligner Cleaning pad block Hard Disk Drive (HDD) missing Cables damaged 2005 vintage.
ELECTROGLAS / EG 6000 is a versatile prober designed for precision measurements of high-speed IC testing for semiconductor fabrication. Using a highly accurate 6-axis scanning equipment, this prober delivers an advanced probing solution for short, medium, and long wafer sizes. EG 6000 is constructed with a guaranteed accuracy of 0.5 um, with a repeatability of 200-300 um and a total range of up to 2mm. This is achieved through a combination of mechanical, electrical, and digital design features. Its 6-axis scanning system is propelled by three high-precision ground ball screws, allowing for precise up, down, left, right, vertical and horizontal movement. This prober also features an advanced alignment unit, combining a real-time position encoder with onboard PC control to accurately navigate andalign to the target area. In addition, the machine offers numerous advanced test features including an integrated test tool, precise reference mark meaurements, and the option of configuring multiple fixture types. ELECTROGLAS EG6000 also features a high-resolution and low-noise CCD camera, capable of capturing reliable measurements up to a range of 5 microns. The asset enables pixel-level accuracy, image capture, image analysis, and pattern recognition routines in 'real-time'. For improved operation and maintenance, EG6000 was devised with a customer-friendly environment-control software. It comes equipped with a sophisticated air circuit design (active dampening model), which ensures consistent, low-noise operation. Furthermore, the equipment offers multiple tooling options, adjustable numeric parameters, and a robust ESD protection. In conclusion, EG EG6000 is an advanced, high-precision prober offering an array of improved capabilities for fab testing applications. By integrating advanced features and a highly accurate 6-axis scanning system, the unit provides users with reliable accuracy and repeatability, enabling efficient wafer testing and analysis.
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