Used ELECTROGLAS / EG Horizon 4080X #293767732 for sale

ELECTROGLAS 4080X prober is a versatile and high-accuracy probing platform designed for automated wafer test and wafer-level probe applications. It is equipped with a richly featured software package, allowing for greater flexibility and control of the testing process. 4080X includes a fast and accurate 4-axis high-speed drive system, offering 120-micron resolution and repeatability in the X-Y plane. The temperature-controlled high-resolution probes, operating over a wide range of temperature and pressure, ensure reliable test results and minimize failure due to thermal shock. The large 6" chuck is capable of accommodating multiple wafer sizes and can handle up to 12 wafers in one cycle. The robust test instrument includes several advanced features such as a high-speed force sensing module with a wide dynamic range to measure forces accurately and precisely. A contact test module offers fast testing and handling, allowing for minimal time between tests. The prober also has low-energy static discharging capabilities, reducing risks to sensitive materials. Its open architecture allows for integration with new or existing automated tools and SEMI-S2 compliant communication. The user-friendly Windows-based software package allows for the configuration and customization of probes according to the specific testing parameters of each application. It also provides clear graphical indication of test results, complete with detailed post-measurement data. The probes can be controlled remotely or with the intuitive software interface. Overall, ELECTROGLAS 4080X prober is an excellent tool for testing and probing of wafers. Its high precision and accuracy, flexible integration, and simple user interface make it an excellent choice for a wide variety of applications.