Used ELECTROGLAS / EG Horizon 4080X #293767858 for sale

ELECTROGLAS 4080X is an advanced prober designed for applications requiring sophisticated probing and testing capability with high accuracy and throughput. It is suitable for test and validation of semiconductor wafers that require very precise measurement, alignment and contact. 4080X features a high speed motion system with a maximum velocity of over 400 cm/sec and an acceleration rating of up to 60 m/s2. It also has an automated metrology system which provides the highest resolution seamless measurement. This feature enables the prober to study the boundaries of a feature such as defects, contacts and solder bump pads as small as 200nm. Additionally, it's a compact design uses a minimum of floor space and has a small footprint. ELECTROGLAS 4080X has a simple yet robust user interface. This feature combines graphical media and operation capabilities that enables users to configure and control the prober with ease. It also offers various operation modes including manual, semi-automatic and automatic for various probing and test requirements. The prober is equipped with a wide range of probe cards from Shuster, Cascade Microtech, Alcami and others with different geometries, sizes and contact densities up to 3.12mm. 4080X can also house 2 probe cards in a single automated loading process - a feature that is not available on other comparable models. ELECTROGLAS 4080X also has a programmable multi-zone chuck that maintains high levels of repeatability and precision. This feature makes the prober ideal for multiple device testing applications. Additionally, the prober offers skilled operators a host of both engineering and customization options including custom macro scripts, remote management and fault assessment. 4080X is the most advanced prober available on the market and is well-suited for high precision wafer testing. It offers an impressive combination of speed, accuracy and ease of use, making it the best option for automated probing and testing.