Used ELECTROGLAS / EG Horizon 4080X #293831233 for sale

ELECTROGLAS 4080X is a highly reliable, high-performance prober equipment designed to meet the rigorous demands of complex wafer probing applications. This prober is a next-generation wafer prober that combines a robust design and advanced technology to provide reliable and repeatable measurement results on a wide variety of semiconductor devices. 4080X features a state-of-the-art probing platform powered by an open-architecture system, allowing for easy installation and integration with existing test equipment. The ergonomic design ensures that the operator can move freely and comfortably while also maintaining proper vision of the wafer map and probing samples. A host PC is used to control the unit and store results. The PC provides an intuitive interface for easy operation and programming. ELECTROGLAS 4080X is capable of testing up to 25 wafers per hour, achieving throughput speeds of up to 1500 wafers per hour using the efficient batch-processing capabilities. The machine offers maximum throughput for low electrical and probe-to-wafer contact forces, reducing surface damage and ensuring long probe life. The tight tolerances of the probes and sample supports are maintained to provide repeatable measurements for quality assurance. 4080X is equipped with an X/Y automatic wafer alignment stage, an optical microscope image capture, and a laser-based wafer chucking tool to ensure accurate and repeatable alignment of samples. The prober provides advanced feature recognition capabilities to identify sample characteristics and match those features to the description on the program, thus ensuring repeatable product alignment. Additionally, the asset features a patented probe-desing facility that streamlines the planning of new-product introductions, as well as a dual substrate fixture model to enable concurrent testing of multiple substrates. ELECTROGLAS 4080X features built-in environmental monitoring, allowing operators to monitor environmental parameters to ensure optimal results. This prober is equipped with a host of customized options, including load programs, on-board test services, probe card maintenance options, and advanced measurement capabilities. 4080X prober equipment provides an advanced, robust and repeatable testing platform for engineering, R&D, and production environments. This high-performance prober is easy to use and configure for various probing applications, making it ideal for testing and analyzing a variety of semiconductor devices.