Used ELECTROGLAS / EG Horizon 4080X #9250606 for sale

ELECTROGLAS / EG Horizon 4080X
ID: 9250606
Vintage: 1993
Wafer prober 1993 vintage.
ELECTROGLAS / EG Horizon 4080X prober is a full featured auto prober ideal for high volume semiconductor device testing. It is a next-generation advanced prober with a proven track record of providing reliable, accurate and repeatable results for device testing and probing applications. The prober is highly adaptive and can adapt itself to a wide variety of wafers and probe cards without the need for complicated and lengthy setup. The prober is equipped with a proven high accuracy 500mm X Y scanning stage which offers extreme precision in the scanning range allowing the user to accurately map out large areas of the wafer. This coupled with a high-speed, low-noise stepper motor provides excellent performance and accuracy in wafer probing operations. The prober also features an innovative die-centering equipment which accurately positions substrates and die on wafers. It also includes wafer alignment system that accurately locates sample die on wafers for reliable and repeatable probing. Furthermore, it is capable of probing multi-die wafers as well as thin and ultra-thin wafers. The prober has an intuitive user interface which allows for quick and easy setup. It can store multiple user setups and automatically select the appropriate setup depending on the wafer probing requirements. The unit also includes powerful diagnostic tools which can identify problems easily and perform automated wafer testing. Furthermore, the prober is equipped with an IEEE488 instrument control interface which allows direct connection to computers for complex tests and measurements. EG Horizon 4080X prober offers a unique combination of advanced features and powerful tools for a variety of device testing and probing applications. Its features make it ideal for applications such as device and wafer testing, die probing, and component assembly. The machine is capable of providing superior performance and accuracy for a variety of wafer probing and testing applications.
There are no reviews yet