Used ELECTROGLAS / MARTEK AUTOMATION 4090 #9412204 for sale

ID: 9412204
Prober.
ELECTROGLAS / MARTEK AUTOMATION 4090 is an automated prober designed for efficient wafer probing. This equipment is an all-in-one solution that includes a fully automated probe station and features multiple configurations to meet various testing needs. This system offers high-precision accuracy, fast throughput, and repeatable results. It is able to perform automated wafer probing, testing, and inspection with wafers ranging from 50mm to 300mm sizes. The Automation ELECTROGLAS 4090 has a high-speed wafer-handling robot that moves the wafer between the prober base and the probe head for faster throughput. This robot also supports manual operation when needed. The unit has a PC-based Probe Programming Window that allows graphically programming probe testing and set up. It supports various contact parameters and test algorithms. The machine also has a Web-based EOMA Monitoring Window that displays tool status and provides contact-level pass/fail information. The Automation MARTEK AUTOMATION 4090 has advanced virtual probe contact control which allows for accurate contact performance under controlled conditions of pressure, time, speed, and force. It also has a probe head that is adjustable in X, Y, and Z axes, providing extra flexibility and minimizing touch-and-retouch problems. The Automation 4090 is capable of testing standard products, as well as complex products, with high consistency and repeatability. The Automation ELECTROGLAS / MARTEK AUTOMATION 4090 also features an intuitive user interface, allowing users to set up and run it with a few simple steps. The asset is compatible with a wide range of software, such as Autotest, Vtouch, and GDS2, which means that users can customize their testing needs to the software they choose. The Automation ELECTROGLAS 4090 comes with a variety of accessories, such as wafer chucks, prober chucks, and sample pods, for efficient testing. In conclusion, MARTEK AUTOMATION 4090 is a comprehensive prober with efficient wafer probing capabilities. It offers a powerful and reliable way to perform automated testing and inspection with repeatability, accuracy, and consistency. It is an all-in-one solution with customizable configurations that can meet various testing needs with high throughput.
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