Used ELECTROGLAS SVTR #9201509 for sale

ELECTROGLAS SVTR is a compact, versatile, and reliable prober platform designed for use in semiconductor yield enhancement and process optimization. It is a sophisticated and powerful tool that enables quick and precise probing of device chips. It is designed for the production and testing of current chips featuring tight pitch rails, flatpack modules, thin-film components, and wafer level packaging (WLP). SVTR features a robust and rigid design for high precision and repeatability, with fast settling times for the probes for low error rates and minimized cost of ownership. This prober is constructed to accommodate prober cards for improving dynamic range of probing, and to allow for an interchange of prober tools configuration, making it ideal for a variety of applications. It has a built-in ultra-high-resolution wafer mapping for greater accuracy and reliability, as well as a built-in DIOS feature to ensure repeatable probing conditions over multiple probing sessions. The prober is designed to be fast, accurate, and reliable with a highly efficient production capacity and flexibility afforded through various probe card configurations. The advanced software and hardware of ELECTROGLAS SVTR allows for automating probing of up to four test sites at a time with enhanced data collection capabilities. The prober also has an integrated vision system that scans patterns on the wafer surfaces to ensure accuracy and reliability of probing. Further, SVTR is configured with a central robot system that uses advanced algorithms to detect and detect faults with an accuracy of up to 1µm tolerances. It also features easy setup with a profile-based start-up feature, allowing probe card operations to be started and completed quickly. It also provides seamless data acquisition and analysis with EDMC using high-speed process connections. Overall, ELECTROGLAS SVTR is an advanced, efficient, and rugged prober that offers accurate probing and high-throughput capabilities to enhance semiconductor yield and process optimization. It is designed to enable fast and precise probing of devices to meet the demanding needs of the semiconductor production process and to provide data collection and analysis capabilities. Its advanced features and robust construction make it an ideal choice for a variety of semiconductor and device chip tests.