Used FITTECH IPT6000 #9036940 for sale
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ID: 9036940
Vintage: 2011
LED chip / wafer probing and testing systems
Shield designed to eliminate back light interference
Build-in optical linear encoder
Recordable vocal alert system
Brightness measured by silicon PD
Currently operational
2011 vintage.
FITTECH IPT6000 offers a complete system for testing integrated circuits and devices with sub-micron feature sizes, while also offering the flexibility to measure a wide variety of part types and technologies. IPT6000 is a full-featured, high resolution prober with a rotating X/Y stage and PC-controlled Z stage which allows for the simultaneous testing of various device sizes up to a maximum part size of 6.0" x 6". It is capable of probing down to 0.25µm intervals, providing the highest resolution available for current and next-generation chip technology. FITTECH IPT6000 supports multiple test configurations including high-speed production, multi-frequency, parametric and failure analysis. It has multiple high-speed pin multiplexers to reduce time-intensive parallel that is necessary for high-speed test applications. The probe card design is versatile enough to support radii capture, single stones, multi stones, contact vertical sets, flip chip bump, as well as array contact and bond pad testing. The prober is equipped with an automatic load/unload station with dual overhead cameras to accurately position the parts. The setup and process control are IPT6000-preset, allowing for an easier operation. The advanced graphical user interface enables users to monitor their process parameters in real-time and to quickly adjust them accordingly. The robustness of the prober allows for high-frequency parametric testing, including wafer sort, fast thermal characterization, Auger testing, calibration, and high-speed die characterization. FITTECH IPT6000 is particularly effective for low-noise, high-resolution testing of Broadband ICs, discrete components, and power devices. The probe system is unique in its ability to provide a comprehensive test solution. It is capable of connecting to a multi-block mainframe to allow for a scalable solution and simultaneous access to multiple test handles. IPT6000 supports several I/O configurations, such as USB, Ethernet, and GPIB, allowing easy connection to a variety of test instruments. FITTECH IPT6000 offers comprehensive solutions for production test, lab environment, and a variety of research and development applications. Its premium performance, high-speed, and accuracy guarantee reliable testing and fast return on investment.
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