Used FITTECH IPT6000 #9244943 for sale

FITTECH IPT6000 is a multifunctional prober designed specifically for semiconductor wafer testing and analysis. It offers a variety of features and capabilities that allow customers to easily integrate into existing production lines. IPT6000 is a fully automated solution that enables wafer probing on a wide range of semiconductor chips. It features multiple tool configurations to adapt to a variety of requirements, including manual, automatic, and semi-automatic modes. This equipment is ideal for advanced testing, evaluation, quality assurance, and production of semiconductor chips. The prober offers a number of different probe cards, including dry and wet test models and manual spring-loaded testers. The automatic probe card offers precise automated placement of the probe, while the manual spring-loaded tester provides adjustable pressure, speed, and accuracy. FITTECH IPT6000 has an integrated cassette loading system that automatically loads and unloads wafers from the prober, reducing manual handling time. It also features an advanced S22TC/SP power supply, offering precise control and high-speed testing for improved accuracy and throughput. IPT6000 is equipped with advanced data analysis software, allowing customers to quickly analyze large amounts of data in real-time. The unit offers four options for data output, including the intuitive Graphical User Interface (GUI), the Graphical Analysis (GA) software, and the data output files (Dot, CSV, and XLS). FITTECH IPT6000 is designed to maximize throughput, accuracy, and reliability, so customers can confidently trust its results. It features excellent troubleshooting capabilities to quickly identify and solve problems, as well as an intuitive user interface with easy navigation. In addition, the machine is fully certified and compliant with IEC standards, ensuring the highest level of safety. IPT6000 is a powerful, cost-effective solution that can be easily integrated with existing production lines. It offers customers reliable testing and analysis capabilities, reduce downtime, and improve productivity.