Used FITTECH IPT7100 #9358872 for sale

FITTECH IPT7100
Manufacturer
FITTECH
Model
IPT7100
ID: 9358872
LED Chip / Wafer probing and testing system.
FITTECH IPT7100 prober is a tool used to measure electrical characteristics of small samples and test their reliability. This prober brings accuracy, flexibility and control to chip testing. IPT7100 incorporates the latest technology for efficient, precise probing on a variety of sample sizes and materials. FITTECH IPT7100 features a non-contact air-dielectric probe head that is designed to handle samples from 50 to 80um in thickness. This allows for a wider variety of tests to be performed than traditional probers that would otherwise work on much thicker samples. With its high speed scanning and signal-processing capacity, IPT7100 can perform up to 1 million points per second. FITTECH IPT7100 is also equipped with eight high-stability signal conditioning channels, each offering a range of 600V peak-to-peak, 10uA bias, and 10V compliance voltage. This helps ensure the highest accuracy and resolution when measuring electrical characteristics of samples. IPT7100 is also designed with maximum user-friendliness in mind. Through the use of a 14-inch touch screen, the user can control and monitor the parameters, functions, and progress of the test. The prober also includes an embedded system that allows multiple probe assemblies to be managed and controlled remotely. Furthermore, an intuitive software package is available to customize and automate the prober's functions within any testing environment. Aside from its technical advantages over other probers, FITTECH IPT7100 is also designed for easy maintenance. With a self-diagnostics feature, problematic signals can be quickly identified and corrected, eliminating the need for manual repair. To ensure reliable and accurate performance, the prober also includes a robust and modular programming system. IPT7100 prober is a versatile and reliable solution to all testing needs. Its combination of superior accuracy, signal processing power, and flexibility make it the perfect choice for chip testing and sample analysis. Its user-friendly interface, remote access, and robust performance further add to its advantages over traditional probers.
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