Used FITTECH LFP6000 #293659505 for sale

The FITECH FITTECH LFP6000 prober is a high-performance test solution for probing delicate semiconductor materials, providing reliable and accurate readings for the characterization of semiconductor materials. Equipped with an 8-axis scan head that moves rapidly between test locations, the prober allows automated probing of materials at ultrafine resolutions as small as 40 µm. The prober is capable of producing high quality data sets with repeatable accuracy and minimal drift in readings. The FITECH LFP6000 prober is designed to test a wide variety of materials such as silicon, gallium nitride, aluminum nitride, and even specialty materials like graphene. The prober uses a Contact and Non-Contact system, that allows users to interchange probes quickly and accurately. The prober provides multiple functions such as wafer scanning, die-to-die probing, die-to-package probing, and the measurement of electrical parameters. Moreover, the prober has a bar code scanners, that can be used to rapidly read and store wafer information and further enhance probing accuracy. The prober is optimized to reduce cycle time with its fast data transfer rate. It also boasts a Vacuum chucking system with a patented vacuum hold, allowing for tight and reliable sample alignment. Furthermore, the prober has an option of manual or automatic wafer loading process. The automatic wafer loading process allows for higher accuracy and repeatability. FITTECH LFP6000 prober has built in inspection functionality to ensure accuracy. It utilizes a variety of metrology systems and vision systems for inspecting and validating wafer and die integrity. Additionally, the prober is equipped with an in-situ defect microscope, enabling automated imaging of suspected defect areas prior to probing. Overall, the FITECH LFP6000 prober offers a reliable and accurate solution for semiconductor test and characterization, with a variety of probing functions and inspection capabilities. It is an ideal tool for characterizing new and delicate materials with the tightest resolution and repeatability requirements.