Used FITTECH LFP6000 #293662292 for sale

FITTECH LFP6000 is a prober designed for performing high-precision probing and laser alignment of microelectronic devices and discrete components. It can be used as a prober for performing direct contact testing or as a laser alignment tool for precise positioning of the probe tip to the targeted device. The prober provides a single-point probing force sensor that can apply adjustable pressure up to 3 Newtons. It has a unique ergonomic design which enables the comfortable adjustment of the probe arm to the desired location. This prober has a dual-axis stage which is capable of providing ultra-fine alignment with sub-micron repeatability. The stage has a scanning speed of up to 7.5 millimetres a second for fast and accurate sampling. The motion range of the stage in the X-Y plane is 200 millimetres each. It also features a motorised Z-axis which is designed for fine-tuning the level between the device under test and the probe. The prober also includes a focus-free microscope head with 10x magnification and variable brightness which provides a clear and precise view of the probing area. This microscope can be used in conjunction with the prober's integrated laser for achieving precise alignment of the probe to the device under test. The laser has a wavelength of 650nm and a power output of 1mW. The prober also includes a variety of software tools which aid in efficient data transfer and data analysis. These tools are compatible with Windows operating systems and allow users to set up, control, measure and analyse data automatically. A library of easy-to-use programs that allow for automated testing are also available, making the performance of multiple measurements and tests faster and more efficient. The prober comes with a 3 year warranty and is CE certified for use in European markets. It is an ideal solution for non destructive testing, failure analysis, system analysis, semiconductor testing, wafer probing and component analysis. With its reliable, accurate performance and intuitive user interface, it is a great choice for users who require high precision probing of microelectronic devices.