Used GIGATEST GTL 4040 #9111372 for sale
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ID: 9111372
Precision large area probe station
Test board area: 18" x 18"
Overall platform travel: 4" x 3" x 2"
Sliding platens with unique locking
Up to 8 GTL micropositioners
Calibration substrate holder vacuum-base
High-volume vacuum pump
Stereozoom microscope optics
Rigid microscope-bridge
Free-motion articulating arm
Halogen-ring illumination system
Color video system with LCD display
(7) Way vacuum distribution system
Vacuum-base PCB fixturing kit
Option:
Leica Stereozoom Triocular microscope with fiber optic ring illuminator
Color video system:
CCD Camera
Video display
(4) Fine position probe positioners with vacuum base:
(1)East & West
(1) North & South
Rigid microscope bridge
(2) 5-Position vacuum manifolds for manipulators
Thin film substrate vacuum holder.
GIGATEST GTL 4040 Prober is a powerful, high-precision test equipment designed to meet the stringent requirements of today's advanced technology products. This system consists of a high-resolution, high-accuracy prober, a linear motor driven wafer chuck, and software for automated wafer probing. The prober is capable of performing wafer probing and die testing with extreme accuracy and repeatability. GTL 4040 Prober is designed to provide a reliable, high-resolution and repeatable testing platform for a variety of applications including semiconductors, electronic components and even nano- structures. It is designed to accurately identify and differentiate materials with very small dimensions as small as 1µm and down to 0.1µm, without compromising accuracy or reliability. The prober itself is comprised of a linear motor driven wafer chuck with built-in precision feedback and control capabilities. The unit also includes an advanced vision machine for automatic wafer scanning and detection, with a 0.2µm repeatability for precision wafer detection and alignment. GIGATEST GTL 4040 Prober features a highly precise and repeatable drive tool that enables extremely accurate positioning of the wafer chuck up to 7 axes. This allows for complex die tests to be performed with extreme accuracy and repeatability. The wafer chuck also includes an internal table for fast mechanical probing, as well as several independent probe cards for more precise testing. GTL 4040 Prober is ideal for high-volume production testing. Its flexible and user friendly probing software is designed to simplify testing, reduce test times and increase throughput. The adaptive test head makes it easy to configure the asset to any test application and its comprehensive wafer data capture and analysis model makes it an invaluable tool for process development and debugging. GIGATEST GTL 4040 Prober is an essential instrument for high-volume, precise and repeatable wafer level testing. It is designed to meet the stringent requirements of today's most advanced technology products, while providing a reliable, high-resolution and repeatable testing platform. GTL 4040 Prober offers the highest accuracy and repeatability, enabling precise and consistent results in production and process development applications.
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