Used INFINITY SCIENTIFIC Probe station #293665804 for sale

ID: 293665804
Wafer Size: 8"
Vintage: 2003
8" 2003 vintage.
INFINITY SCIENTIFIC Probe station is an advanced prober for highly accurate measurements and diagnostics of integrated circuit (IC) designs. This high-precision Probe station is designed for both wafer-level and package-level testing and includes a host of modern features such as vision alignment, programmable temperature control, zone heating, and accuracy within 1μm. The optical microscope included in the station is motorized and can move along with the probe to facilitate accurate alignment. The motorized feature allows the user to easily adjust the microscope's position and magnification in order to examine multicore ICs. To ensure accuracy and repeatability, the position of the microscope can be locked with a joystick. This station also includes an advanced computer interface and software which allow users to control and capture relevant data from their IC. Data is displayed in both graph and tabular format, depending on the user's specified format, and as software updates are made by INFINITY SCIENTIFIC, their customers are able to benefit from the latest advancements. The temperature control of the station helps in simulating working conditions of semiconductor devices in order to apply voltage, current and airflow. Its heating system is specially designed to detect even the slightest changes in temperature and the zone heating feature allows users to lock the temperature by area for multiple sample testing. The station houses a wide variety of probes with varying diameters, materials and shapes. The probes are specially designed to reduce electrical interference and provide accuracy when making highly detailed measurements. The high-tech mechanical design of this station incorporates an automatic rail system that allows the user to easily move the prober to different positions on the tray. This system is not only convenient, but it also ensures that the probes maintain accurate alignment with the tray. Overall, this prober makes testing and diagnostics of IC designs more accurate and efficient for engineers and technicians. Its features and components are designed for the highest precision while providing the user with an effortless and enjoyable experience.
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