Used JANDEL RM3-AR #293747574 for sale

JANDEL RM3-AR is a precision prober equipment used for ohmic and semiconductor probing applications. It is designed for high accuracy and repeatability with a resolution of 5 nanometers, making it ideal for applications such as production test and wafer-level reliability testing. RM3-AR is composed of four main components; the base platform, the controller, the probe head system, and the probe cards. The base platform consists of a robust and stable frame with built-in high-precision motorised linear actuators allowing for accurate XYZ positioning in three directions. The XY travel range is 0.2mm to 50mm and a Z range from 0.2mm to 25mm. The controller is composed of powerful and highly efficient processors with a large memory capacity for storing programs and results. The probe heads and associated contact probes are positioned into JANDEL RM3-AR with precision using a manual or automated vertical stage. The probe head unit is compatible with a variety of contact probes such as needle probes, pin probes, and coaxial contacts. The probe cards can be used to connect the prober to a variety of test systems for automated operation. The cards feature a high degree of flexibility with variable pin count and configurations for complex device test. RM3-AR is equipped with a wide range of powerful software for controlling the prober and the test machine. The software includes a comprehensive set of functions for operating the prober, including wafer mapping, single and multi-site testing, and single and multiple die testing. Additionally, it provides tools for designing test programs, creating test recipes, calibrating probers for accuracy and precision, and performing statistical quality analysis of test results. In summary, JANDEL RM3-AR is a professional-grade prober tool with exceptional accuracy, repeatability, and flexibility. Its versatile components, software control features, and range of compatible testing systems make it an outstanding choice for production test and wafer-level reliability testing.